The Effect of Vacuum Pressure During Fabrication of Zinc Sulphide Thin Film Using Thermal Evaporator

Abstract

Zinc sulphide is a remarkable semiconductor material, with its highly demanded optical, electrical properties and its availability, it is used in the field of photovoltaic applications. The objectives are to investigate the effect of vacuum pressure on the glass substrate and the study different cluster models based on its crystal size. The ZnS thin films were fabricated using a thermal evaporator at the pressure of 10^-5 Torr, 10^-6 Torr, and 10^-7 Torr. Four different size cluster models have been characterized theoretically. Each model was built based on the size of crystal structures, optimized to the lowest energy level, and evaluated as realistic clusters. The structural and optical properties of the thin films were studied using X-ray diffractometry, absorption, and photoluminescence spectroscopy respectively. Significant differences were observed in the crystal structure and optical properties of fabricated MoS₂ thin films at different pressures.