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  • Effect of Image Compression using Fast Fourier Transformation and Discrete Wavelet Transformation on Transfer Learning Wafer Defect Image Classification

    Jessnor Arif Mat Jizat, Dr. Ahmad Fakhri Ab. Nasir, Dr. Anwar P.P Abdul Majeed, Edmund Yuen
    16-22
    2020-06-05
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Indexed in:

Mekatronika : Journal of Intelligent Manufacturing and Mechatronics | ISSN: 2637-0883 (Online)
Faculty of Manufacturing and Mechatronic Engineering Technology
Universiti Malaysia Pahang Al-Sultan Abdullah
26600 Pekan, Pahang, MALAYSIA

© Universiti Malaysia Pahang Al-Sultan Abdullah Publishing

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