Mat Jizat JA, Ab. Nasir AF, P.P Abdul Majeed A, Yuen E. Effect of Image Compression using Fast Fourier Transformation and Discrete Wavelet Transformation on Transfer Learning Wafer Defect Image Classification . Mekatronika: J. Intell. Manuf. Mechatron. [Internet]. 2020 Jun. 5 [cited 2024 Jul. 22];2(1):16-22. Available from: https://journal.ump.edu.my/mekatronika/article/view/6704