Mustapa NA, Senawi A, Wei H-L. Supervised Feature Selection based on the Law of Total Variance. Mekatronika: J. Intell. Manuf. Mechatron. [Internet]. 2023 Dec. 28 [cited 2024 Nov. 22];5(2):100-1. Available from: https://journal.ump.edu.my/mekatronika/article/view/9998