MUSTAPA, N. A.; SENAWI, A.; WEI, H.-L. Supervised Feature Selection based on the Law of Total Variance. Mekatronika: Journal of Intelligent Manufacturing and Mechatronics, [S. l.], v. 5, n. 2, p. 100–110, 2023. DOI: 10.15282/mekatronika.v5i2.9998. Disponível em: https://journal.ump.edu.my/mekatronika/article/view/9998. Acesso em: 15 may. 2024.