MAT JIZAT, J. A.; AB. NASIR, A. F. .; P.P ABDUL MAJEED, A.; YUEN, E. . Effect of Image Compression using Fast Fourier Transformation and Discrete Wavelet Transformation on Transfer Learning Wafer Defect Image Classification . Mekatronika: Journal of Intelligent Manufacturing and Mechatronics, [S. l.], v. 2, n. 1, p. 16–22, 2020. DOI: 10.15282/mekatronika.v2i1.6704. Disponível em: https://journal.ump.edu.my/mekatronika/article/view/6704. Acesso em: 29 mar. 2024.