Mat Jizat, J.A. et al. 2020. Effect of Image Compression using Fast Fourier Transformation and Discrete Wavelet Transformation on Transfer Learning Wafer Defect Image Classification . Mekatronika: Journal of Intelligent Manufacturing and Mechatronics. 2, 1 (Jun. 2020), 16–22. DOI:https://doi.org/10.15282/mekatronika.v2i1.6704.